Paper Titles

Surface Characteristics and Modification of Different Carbon Materials
p.217

Improved Materials for Environmental Application: Surfactant-Modified Zeolites
p.223

Microstructure Evolution and Dielectric Properties of Nb/Mn and Dy/Mn Doped Barium Titanate Ceramics
p.229

Electrical Characterization of the Grain-Boundary Region of SnO₂ Varistors
p.235

Structural and Dielectric Properties of BaTi_1-xSn_xO₃ Ceramics
p.241

Segmented Thermistors Printed by NTC Nanometric Paste and Applied in Volume Air-Flow Sensors
p.247

Electrocatalytic Activity of Nano-Sized Ebonex/Pt for Underpotential Deposition of Hydrogen
p.253

Structural Effects in Electrocatalysis: Formic Acid Oxidation at Model and Real Pt Catalysts
p.259

Electrochemical Behaviour of a Composite Rh/TiO₂ Layer Formed Potentiodynamically on Titanium Surface
p.265

HomeMaterials Science ForumMaterials Science Forum Vol. 518Structural and Dielectric Properties of...

Structural and Dielectric Properties of BaTi_1-xSn_xO₃ Ceramics

Article Preview

Abstract:

BaTi1-xSnxO3 (BTS) powders, with x ranging from 0 to 1, were synthesized by solid-state reaction technique. The powders were pressed into pellets and sintered at 1370 and 1420 oC. The structural characterization of sintered BTS samples was made at room temperature using X-ray diffraction and Raman spectroscopy measurements. The BTS samples were found to be singlephase solid solutions. Dielectric properties of sintered BTS samples were studied as a function of sintering temperatures and tin contents, too. For samples with x ranging from 0 up to 0.15, it has been found that the Curie temperature decreases while the maximum of the dielectric constant increases with increasing tin content. These samples have relatively high dielectric constants, contrary to x > 0.2 samples with very low dielectric constants. It is noticed that BTS ceramics sintered at 1420 oC exhibit better dielectric properties than those sintered at 1370 oC.

You might also be interested in these eBooks

Recent Developments in Advanced Materials and Processes

Info:

Periodical:

Materials Science Forum (Volume 518)

Pages:

241-246

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.518.241

Citation:

Cite this paper

Online since:

July 2006

Authors:

S. Marković, M. Mitrić, N. Cvjetićanin, Dragan P. Uskokovic

Keywords:

BaTi_1-xSn_xO₃, Dielectric Property, Phase Transformation, Solid-State Reaction, X-Ray Diffraction (XRD)

Export:

RIS, BibTeX

Price:

Permissions:

Request Permissions

Сopyright:

© 2006 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] J. -H. Jeon: J. Eur. Ceram. Soc. Vol. 24 (2004), p.1045.

[2] J. -H. Jeon, Y. -D. Hahn and H. -D. Kim: J. Eur. Ceram. Soc. Vol. 21 (2001), p.1653.

[3] W. -K. Chang, S. -F. Hsien, Y. -H. Lee, K. -N. Chen, N. -C. Wu and A.A. Wang: J. Mat. Sci. Vol. 33 (1998), p.1765.

[4] N. Yasuda, H. Ohwa and S. Asano: Jpn. J. Appl. Phys. Vol. 35 (1996), p.5099.

[5] R. Farhi, M. El Marssi and A. Simon: J. Ravez, Eur. Phys. J. B Vol. 9 (1999), p.599.

[6] N. Yasuda, H. Ohwa and K. Arai: J. Mat. Sci. Letters Vol. 16 (1997), p.1315.

[7] F.D. Morrison, D.C. Sinclair and A.R. West: J. Appl. Phys. Vol. 86 (1999), p.6355.

[8] N.S. Novosiltsev and A.L. Khodakov: Zh. Tekh. Fiz. Vol. 22 (1956), p.310.

[9] G.A. Smolenskii, V.A. Bokov, N.N. Isupov, V.A. Krainik, R.E. Pasynkov and М.S. Shur: Ferroelectrics and anti-ferroelectrics (Izd. Nauka, Leningradskii Otdeleniye, Leningrad 1971), pp.355-369 (in Russian).

[10] V. Muller, H. Beige, H. -P. Abicht and C. Eisenschmidt: J. Mater. Res. Vol. 19 (2004), p.2834.

[11] R. Steinhausen, A. Kouvatov, H. Beige, H.T. Langhammer and H. -P. Abicht: J. Eur. Ceram. Soc. Vol. 24 (2004), p.1677.

[12] U. Straube, H.T. Langhammer, et al.: J. Eur. Ceram. Soc. Vol. 19 (1999), p.1171.

[13] V. Mueller, L. Jager, H. Beige, et al.: Solid State Comm. Vol. 129 (2004), p.757.

[14] R.D. Shannon and C.T. Prewitt: Acta Cryst. B Vol. 25.

[5] (1969), p.925.

[15] D.E. Rase and R. Roy: J. Am. Ceram. Soc. Vol. 38 (1955), p.102.

[16] T.J. Parker and C.J. Burfoot: Brit. J. Appl. Phys Vol. 17 (1966), p.207.

[17] Y. -I. Kim, J.K. Jung and K. -S. Ryu: Mat. Res. Bull. Vol. 39 (2004), p.1045.

[18] M. DiDomenico, S.H. Wemple, S.P.S. Porto and R.P. Bauman: Phys. Rev. Vol. 174 (1968), p.522.

[19] S.W. Lu, B.I. Lee, Z.L. Wang and W.D. Samuels: J. Cryst. Growth Vol. 219 (2000), p.269.