3-Dimensional Micro-Structure Inspection by Phase-Shifting Digital Holography

Hae Young Yun; Seung Jun Jeong; Jeon Woong Kang; Chung Ki Hong

doi:10.4028/www.scientific.net/KEM.270-273.756

Paper Titles

Thermal Annealing Effects of the CdIn₂Te₄ Single Crystal Obtained from Photoluminescence Measurement
p.729

360-Deg Profilometry of 3-D Object by Multi-Reference-Planes Method
p.736

Application of Micro-ESPI Technique for Measurement of Micro-Tensile Properties
p.744

Measurement of the Piping Elbow Integrity Using the Fiber-Optics Technique
p.750

3-Dimensional Micro-Structure Inspection by Phase-Shifting Digital Holography
p.756

Fiber-Optic Displacement Sensor to Detect the Vibration of the Thinned U-Section by FAC
p.762

Optical Measurement of Two-Dimensional Surface Roughness and Texture Using a Scattered Light Intensity Distribution
p.768

Detection of Real Defects in Composite Structures by Laser Techniques
p.775

Nondestructive Evaluation of Internal Defects for Composite Materials by Using Shearography
p.781

HomeKey Engineering MaterialsKey Engineering Materials Vols. 270-2733-Dimensional Micro-Structure Inspection by...

3-Dimensional Micro-Structure Inspection by Phase-Shifting Digital Holography

Abstract:

You might also be interested in these eBooks

View Preview

Info:

Periodical:

Key Engineering Materials (Volumes 270-273)

Pages:

756-761

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.270-273.756

Citation:

Cite this paper

Online since:

August 2004

Authors:

Hae Young Yun, Seung Jun Jeong, Jeon Woong Kang, Chung Ki Hong

Keywords:

Digital Holography, Interference Microscopy, Phase-Shifting Interferometry

Export:

RIS, BibTeX

Price:

Permissions:

Request Permissions

References

[1] K. Creath: Proceedings of Fringe '97, Vol. 3 of Akademie Verlag Series in Optical Metrology (Akedemie-Verlag, Berlin, 1997), p.52.

Google Scholar

[2] T. Wilson ed.: Confocal Microscopy (Academic, London, 1990).

Google Scholar

[3] I. Yamaguchi and T. Zhang: Opt. Lett. Vol. 22 (1997), p.1268.

Google Scholar

[4] I. Yamaguchi, J. Kato, S. Ohta and J. Mizuno: Appl. Opt. Vol. 40 (2001), p.6177.

Google Scholar

[5] Y. Takaki and H. Ohzu: Appl. Opt. Vol. 39 (2000), p.5302.

Google Scholar

[6] L. Yu, Y. An and L Cai: Optics Express Vol. 10 (2002), p.1250.

Google Scholar

[7] A. Stadelmaier: Opt. Lett. Vol. 25 (2000), p.1630.

Google Scholar

[8] S. -W. Kim, M. -G. Kang, and G. -S. Han: Opt. Eng. Vol. 36 (1997), p.3101.

Google Scholar

[9] H. Huang, M. Itoh and T. Yatagi: Opt. Rev. Vol. 6 (1999), p.196.

Google Scholar

[10] J. W. Goodman: Introduction to Fourier Optics (McGraw-Hill Inc, San Fransisco 1968), p.77.

Google Scholar

[11] J. W. Goodman: Introduction to Fourier Optics (McGraw-Hill Inc, San Fransisco 1968), p.48.

Google Scholar