Investigation of TiO2 Ceramic Surface Conductivity Using Conductive Atomic Force Microscopy

Kristaps Rubenis; Karlis Kundzins; Janis Locs; Jurijs Ozolins

doi:10.4028/www.scientific.net/KEM.527.154

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HomeKey Engineering MaterialsKey Engineering Materials Vol. 527Investigation of TiO2 Ceramic Surface Conductivity...

Investigation of TiO₂ Ceramic Surface Conductivity Using Conductive Atomic Force Microscopy

Abstract:

Dense TiO2 (rutile) ceramic samples were prepared by sintering compacts of titanium dioxide anatase powder at 1500 °C for 5h. Sintered samples were polished and annealed in vacuum at 1000 °C for 1h. Structural properties of the samples were studied by X-ray diffraction, polarized light and scanning electron microscopy. The surface topography and local electrical conductivity of the samples were investigated by atomic force microscopy technique under atmospheric conditions. Enhanced electrical conductivity was observed at grain boundaries while the polished, vacuum annealed grains surface showed non-homogeneous conductivity.

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Key Engineering Materials (Volume 527)

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154-158

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.527.154

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Online since:

November 2012

Authors:

Kristaps Rubenis, Karlis Kundzins, Janis Locs, Jurijs Ozolins

Keywords:

Atomic Force Microscopy (AFM), Ceramic, Electrical Conductivity, Microstructure, TiO₂

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