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HomeMaterials Science ForumMaterials Science Forum Vols. 38-41Temperature Dependence of the Capture Cross...

Temperature Dependence of the Capture Cross Section of Se^o as Measured by Microwave Absorption Spectroscopy (MAS)

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Defects in Semiconductors 15

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Periodical:

Materials Science Forum (Volumes 38-41)

Pages:

469-472

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.38-41.469

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Online since:

January 1989

Authors:

T. Pavelka, B. Hemm

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