Macroscopic Fracture Behaviour of CrN Hard Coatings Evaluated by X-Ray Diffraction Coupled with Four-Point Bending

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Abstract:

Fracture behavior of hard nanocrystalline coatings decisively influences the lifetime and performance of coated tools. In this work, residual stresses in as-deposited and annealed CrN coatings deposited at 350 °C using bias voltages of −40 V and −120 V were evaluated using synchrotron X-ray diffraction coupled with four-point bending. The stress development during the bending experiments was used to analyse fracture properties of the coatings. The results indicate that an annealing at 550 °C does not deteriorate the fracture behavior of the coatings prepared using −40 V bias. In the case of −120 V bias coatings, the residual stress relaxation after the thermal treatment is accompanied by a fracture strain decrease and a fracture stress increase. The as-deposited and annealed CrN coatings deposited using −120 V bias exhibit significantly large fracture strains in comparison with −40 V samples. Finally the results document that the fracture stress may not be the only relevant parameter when comparing different coating systems. Also the strain at fracture can be considered as significant indicator of the coating fracture response. Methodologically, the results indicate that in-situ X-ray diffraction coupled with four point bending can be effectively used to evaluate macroscopic fracture behaviour of hard coatings.

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Periodical:

Materials Science Forum (Volumes 768-769)

Pages:

272-279

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Online since:

September 2013

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[1] J. Kopac, M. Sokovic and S. Dolinsek: Tribology of coated tools in conventional and HSC machining, Journal of Materials Processing Technology, Vol. 118 (2001), pp.377-384.

DOI: 10.1016/s0924-0136(01)00974-8

Google Scholar

[2] D. M. Mattox: Particle bombardment effects on thin-film deposition: A review, Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 7 (1989), pp.1105-1114.

DOI: 10.1116/1.576238

Google Scholar

[3] R. Daniel, K. Martinschitz, J. Keckes and C. Mitterer: The origin of stresses in magnetronsputtered thin films with zone T structures, Acta Mater., Vol. 58 (2010), pp.2621-2633.

DOI: 10.1016/j.actamat.2009.12.048

Google Scholar

[4] R. Daniel, K. Martinschitz, J. Keckes and C. Mitterer: Texture development in polycrystalline CrN coatings: The role of growth conditions and a Cr interlayer, J. Phys. D: Appl. Phys., Vol. 42.

DOI: 10.1088/0022-3727/42/7/075401

Google Scholar

[5] I. Petrov, L. Hultman, J. -E. Sundgren and J. E. Greene: Polycrystalline TiN films deposited by reactive bias magnetron sputtering: Effects of ion bombardment on resputtering rates, film composition, and microstructure, Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 10 (1992).

DOI: 10.1116/1.578074

Google Scholar

[6] P. H. Mayrhofer, C. Mitterer, L. Hultman and H. Clemens: Microstructural design of hard coatings, Progress in Materials Science, Vol. 51 (2006), pp.1032-1114.

DOI: 10.1016/j.pmatsci.2006.02.002

Google Scholar

[7] K. Martinschitz, R. Daniel, C. Mitterer and J. Keckes: Stress evolution in CrN/Cr coating systems during thermal straining, Thin Solid Films, Vol. 516 (2008), p.1972 - (1976).

DOI: 10.1016/j.tsf.2007.10.106

Google Scholar

[8] J. D. Verhoeven, Fundamentals of physical metallurgy, Wiley (1975).

Google Scholar

[9] R. Daniel, D. Holec, M. Bartosik, J. Keckes and C. Mitterer: Size effect of thermal expansion and thermal/intrinsic stresses in nanostructured thin films: Experiment and model, Acta Mater., Vol. 59 (2011), pp.6631-6645.

DOI: 10.1016/j.actamat.2011.07.018

Google Scholar

[10] A. Riedl, R. Daniel, M. Stefenelli, T. Schöberl, O. Kolednik, C. Mitterer and J. Keckes: A novel approach for determining fracture toughness of hard coatings on the micrometer scale, Scr. Mater., Vol. 67 (2012), pp.708-711.

DOI: 10.1016/j.scriptamat.2012.06.034

Google Scholar

[11] J. Almer, U. Lienert, R. L. Peng, C. Schlauer and M. Oden: Strain and texture analysis of coatings using high-energy X-rays, J. Appl. Phys., Vol. 94 (2003), pp.697-702.

DOI: 10.1063/1.1582351

Google Scholar

[12] I. C. Noyan and J. B. Cohen, Measurement by Diffraction and Interpretation, Springer (1987).

Google Scholar

[13] F. Ahmed, K. Bayerlein, S. Rosiwal, M. Göken and K. Durst: Stress evolution and cracking of crystalline diamond thin films on ductile titanium substrate: Analysis by micro-Raman spectroscopy and analytical modelling, Acta Mater., Vol. 59 (2011).

DOI: 10.1016/j.actamat.2011.05.015

Google Scholar

[14] S. Frank, U. A. Handge, S. Olliges and R. Spolenak: The relationship between thin film fragmentation and buckle formation: Synchrotron-based in-situ studies and two-dimensional stress analysis, Acta Mater., Vol. 57 (2009), pp.1442-1453.

DOI: 10.1016/j.actamat.2008.11.023

Google Scholar

[15] H. Cox: The elasticity and strength of paper and other fibrous materials, British Journal of Applied Physics, Vol. 3 (1952), pp.72-79.

DOI: 10.1088/0508-3443/3/3/302

Google Scholar

[16] C. Hsueh and M. Yanaka: Multiple film cracking in film/substrate systems with residual stresses and unidirectional loading, Journal of Materials Science, Vol. 38 (2003), pp.1809-1817.

Google Scholar