Comparison of Ground State Search Methods in the Random System of Ising-Like Point Magnetic Dipoles
p.28
p.28
Creation of Electrical Spin Injectors for Silicon Spintronics: Achievements and Prospects
p.32
p.32
Formation, Structure and Optical Properties of Nanocrystalline BaSi2 Films on Si(111) Substrate
p.42
p.42
Structure and Optical Properties of Porous Silicon Formed on Silicon Substrates Treated with Compression Plasma Flow
p.49
p.49
In Situ Mueller-Matrix Magneto-Ellipsometry
p.55
p.55
Modeling of Structures Nanocrystalline and Amorphous Alloys
p.60
p.60
Nanocomposites Based on CdS Quantum Dots for Laser Control Devices
p.67
p.67
Formation of Bulk and Nanocrystallite Layers of GaSb on Silicon
p.72
p.72
Synthesis of Mesoporous CaMoO4 in Aqueous Solution
p.80
p.80
In Situ Mueller-Matrix Magneto-Ellipsometry
Abstract:
We develop the method for determining the Mueller matrix elements using standard photometric ellipsometer. Small ellipsometer design changes give an opportunity to completely determine all elements of the Mueller matrix. It is shown how the values of Mueller matrix elements can be obtained from the measurements at different azimuthal positions of optical units.
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Info:
Periodical:
Solid State Phenomena (Volume 245)
Pages:
55-59
Citation:
Online since:
October 2015
Authors:
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